Application NoteLife Sciences How to validate automated cell counters: Benefits of using validation slides over NIST standard beadsDownload resource
Scientific PosterMaterials Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopyDownload resource
White PapersMaterials Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials propertiesDownload resource
Application NoteMaterials Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMsDownload resource
Application NoteMaterials Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000Download resource
Application NoteMaterials Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operationDownload resource
Application NoteMaterials Optimizing SEM sample preparation with broad ion beam millingDownload resource
Application NoteMaterials The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact designDownload resource
Application NoteMaterials The importance of high-quality cross-sectioning for battery researchDownload resource
Application NoteMaterials ArBlade 5000 – An innovative, high-performance sample preparation tool for SEMDownload resource
Application NoteGeneral Lab The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletopDownload resource
Product BrochuresMaterials FlexSEM: The smart little SEM that flexibly adjusts to your skills and needsDownload resource
Application NoteLife Sciences Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus PantaDownload resource
