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Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

6 Jun 2025

In recent decades, the Field Emission SEM (FE-SEM) has emerged as a lynchpin of analytical science, providing professionals in nearly every scientific and engineering field with several benefits over conventional SEMs and allowing them to understand a plethora of complex processes and emerging technologies. In this application note, Roland Schmidt, Senior Applications Specialist at Hitachi, discusses this innovative technology and Hitachi’s range of FE-SEM microscopes.

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.
Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs