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Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000
6 Jun 2025In this application note, Hitachi High-Tech Europe has compiled answers to some of the frequently asked questions, to help you decide whether ion milling is the right solution for your lab.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.MillingMilling is the process of grinding, crushing, or cutting materials into smaller parts. In scientific research, it plays a crucial role in sample preparation for analysis in areas such as food, pharmaceuticals, and materials science. Explore milling equipment in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.