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Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation
6 Jun 2025In this application note, Hitachi High-Tech Europe demonstrates the recently launched the SU3800SE and SU3900SE scanning electron microscopes (SEMs). The new, advanced field emission optics instruments are set to significantly enhance scientific research and industrial applications.
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SU3800/SU3900 Family
Hitachi High-Tech EuropeModular VP-SEM platform, available with two different sample chambers and two types of electron optics
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.