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Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties
16 Jul 2025In this white paper, ZEISS Research Microscopy Solutions demonstrates how advanced image analysis techniques based on artificial intelligence (AI) can be used for segmenting inclusions in a metal alloy. In this experiment the software ZEN Intellesis, a module of the AI Toolkit of ZEN core and ZEISS arivis Cloud were used as image processing software.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.AlloysImage AnalysisImage analysis involves the extraction of meaningful information from images, often using software to quantify and interpret visual data. It is widely used in cell biology, material science, and diagnostics. Increasingly, AI is being used to streamline image analysis. Explore image analysis tools in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.