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Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy
15 Oct 2025Extracting nanoscale crystallographic insights from beam-sensitive materials remains a challenge in advanced microscopy. Nanobeam 4D STEM offers a powerful solution for orientation, phase, and strain mapping.
Explore how the MerlinEM direct electron detector enables high-resolution diffraction pattern acquisition with fast readout and dynamic range, advancing structural analysis across diverse materials, from irradiated memory films to organic nanoparticles.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.CrystallographyMicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.