Quality and Efficiency: contrAA® Enables Rapid Multi-Element Analysis at a Low Price
Analytik Jena’s contrAA allows analysis of every wavelength of every element thanks to its Xenon lamp
Analytik Jena’s contrAA allows analysis of every wavelength of every element thanks to its Xenon lamp
Delivers Enhanced Optics and Improved Software to Open New Applications
New technologies and tips to make your day-to-day lab work more efficient
High precision positioner now available for loads up to 22lbs
ZEISS introduces an integrated solution to acquire and analyze multi-scale and multi-modal images in light, electron and X-ray microscopy
The company will construct the new building at their Shingai factory
multi EA® 5000 is the solution to analyze liquefied pressurized gases regarding ASTM D 6667 and ASTM D 7551
All essential light microscopy contrasting methods and high precision 3D topography in a single instrument
PI’s newest hexapod, driven by brushless servo motors, easily handles loads to 130 lbs
Reduce your time to result with automated nano-imaging of large samples: image your serial sections fast and efficiently
Improving resolution and signal-to-noise in cryo-fluorescence microscopy with ZEISS LSM 8 confocal microscopes and Airyscan
Special Issue of the Journal of Microscopy celebrates the future of cell imaging