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<em>In-situ </em> fiber push-out tests with the Hysitron PI 88 SEM PicoIndenter

16 Jul 2023

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Simulating the friction of lubricants and materials with a high-frequency reciprocating rig

11 Jul 2023

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Scratch testing of nanofilms for flexible electronics

11 Jul 2023

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Explore Raman Spectroscopy

10 Jul 2023

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Software-based segmentation of metallic inclusions in additive manufactured alloys for microstructure-property linkage

9 Jul 2023

White Papers

Multimodal correlative imaging of microplastics

9 Jul 2023

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Revolutionary productivity for volatile residue and impurity analysis

9 Jul 2023

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In-situ mechanical testing of semiconductor devices

6 Jul 2023

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In-situ electromechanical testing of ZnO nanowires

6 Jul 2023

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In-situ high-temperature study of a Ni-based superalloy and PtNiAl bond coat

6 Jul 2023

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Nanoindentation of duplex stainless steel with e-FlashFS and Hysitron PI 88 SEM PicoIndenter

6 Jul 2023

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Targeted nanoindentation of a high-entropy alloy in the SEM

6 Jul 2023

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Hardness mapping of a DP980 steel sample

6 Jul 2023

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A practical guide to nanoparticle characterization

3 Jul 2023

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Nanoscale IR spectroscopy of organic contaminants

27 Jun 2023

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Characterization of advanced semiconductor materials and processes with nanoscale IR spectroscopy

27 Jun 2023

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2D materials characterization using nanoscale FTIR spectroscopy and near-field imaging

27 Jun 2023

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High-resolution chemical imaging with tapping AFM-IR

27 Jun 2023

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Chemical characterization of polymeric films, blends, and self-assembled monomers

27 Jun 2023

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Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detail

27 Jun 2023

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Spatiospectral nanoimaging of surface phonon plasmons

27 Jun 2023

Product Brochures

Enabling first-and-only nanoIR capabilities and performance with the Dimension IconIR

27 Jun 2023

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nanoIR3 nanoscale IR spectroscopy

27 Jun 2023

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Improving additive manufacturing with accurate surface metrology

25 Jun 2023

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Advantages of measuring surface roughness with white light interferometry

25 Jun 2023

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<em>In-situ </em> fiber push-out tests with the Hysitron PI 88 SEM PicoIndenter

Simulating the friction of lubricants and materials with a high-frequency reciprocating rig

Scratch testing of nanofilms for flexible electronics

Explore Raman Spectroscopy

Software-based segmentation of metallic inclusions in additive manufactured alloys for microstructure-property linkage

Multimodal correlative imaging of microplastics

Revolutionary productivity for volatile residue and impurity analysis

In-situ mechanical testing of semiconductor devices

In-situ electromechanical testing of ZnO nanowires

In-situ high-temperature study of a Ni-based superalloy and PtNiAl bond coat

Nanoindentation of duplex stainless steel with e-FlashFS and Hysitron PI 88 SEM PicoIndenter

Targeted nanoindentation of a high-entropy alloy in the SEM

Hardness mapping of a DP980 steel sample

A practical guide to nanoparticle characterization

Nanoscale IR spectroscopy of organic contaminants

Characterization of advanced semiconductor materials and processes with nanoscale IR spectroscopy

2D materials characterization using nanoscale FTIR spectroscopy and near-field imaging

High-resolution chemical imaging with tapping AFM-IR

Chemical characterization of polymeric films, blends, and self-assembled monomers

Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detail

Spatiospectral nanoimaging of surface phonon plasmons

Enabling first-and-only nanoIR capabilities and performance with the Dimension IconIR

nanoIR3 nanoscale IR spectroscopy

Improving additive manufacturing with accurate surface metrology

Advantages of measuring surface roughness with white light interferometry

Resources

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Search

Selected Filters:

<em>In-situ </em> fiber push-out tests with the Hysitron PI 88 SEM PicoIndenter

Simulating the friction of lubricants and materials with a high-frequency reciprocating rig

Scratch testing of nanofilms for flexible electronics

Explore Raman Spectroscopy

Software-based segmentation of metallic inclusions in additive manufactured alloys for microstructure-property linkage

Multimodal correlative imaging of microplastics

Revolutionary productivity for volatile residue and impurity analysis

In-situ mechanical testing of semiconductor devices

In-situ electromechanical testing of ZnO nanowires

In-situ high-temperature study of a Ni-based superalloy and PtNiAl bond coat

Nanoindentation of duplex stainless steel with e-FlashFS and Hysitron PI 88 SEM PicoIndenter

Targeted nanoindentation of a high-entropy alloy in the SEM

Hardness mapping of a DP980 steel sample

A practical guide to nanoparticle characterization

Nanoscale IR spectroscopy of organic contaminants

Characterization of advanced semiconductor materials and processes with nanoscale IR spectroscopy

2D materials characterization using nanoscale FTIR spectroscopy and near-field imaging

High-resolution chemical imaging with tapping AFM-IR

Chemical characterization of polymeric films, blends, and self-assembled monomers

Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detail

Spatiospectral nanoimaging of surface phonon plasmons

Enabling first-and-only nanoIR capabilities and performance with the Dimension IconIR

nanoIR3 nanoscale IR spectroscopy

Improving additive manufacturing with accurate surface metrology

Advantages of measuring surface roughness with white light interferometry

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