Application NoteMaterials Simulating the friction of lubricants and materials with a high-frequency reciprocating rigDownload resource
Application NoteMaterials Software-based segmentation of metallic inclusions in additive manufactured alloys for microstructure-property linkageDownload resource
Application NoteSpectroscopy Revolutionary productivity for volatile residue and impurity analysisDownload resource
Application NoteMaterials In-situ high-temperature study of a Ni-based superalloy and PtNiAl bond coatDownload resource
Application NoteMaterials Nanoindentation of duplex stainless steel with e-FlashFS and Hysitron PI 88 SEM PicoIndenterDownload resource
Application NoteMaterials Targeted nanoindentation of a high-entropy alloy in the SEMDownload resource
Application NoteGeneral Lab Characterization of advanced semiconductor materials and processes with nanoscale IR spectroscopyDownload resource
Application NoteMaterials 2D materials characterization using nanoscale FTIR spectroscopy and near-field imagingDownload resource
Application NoteSpectroscopy Chemical characterization of polymeric films, blends, and self-assembled monomersDownload resource
Application NoteSpectroscopy Utilizing nanoscale IR spectroscopy to characterize biological samples in nanoscale detailDownload resource
Product BrochuresSpectroscopy Enabling first-and-only nanoIR capabilities and performance with the Dimension IconIRDownload resource
Application NoteMaterials Improving additive manufacturing with accurate surface metrologyDownload resource
Application NoteMaterials Advantages of measuring surface roughness with white light interferometryDownload resource
Application NoteMaterials Achieving gage-capable process control for high-speed, precision manufacturingDownload resource
