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Achieving gage-capable process control for high-speed, precision manufacturing

25 Jun 2023

In this application note, Bruker Nano discusses gage studies and its latest metrology advancements that help manufacturers and engineers meet the increasingly stringent demands for high-end applications. Solid, gage-proven metrology is an essential tool for process control across all industrial settings. A good measurement system enables manufacturers – ranging from factories that operate 24/7 and incorporate high-volume, high-end processes to medical instrument production performing critical FDA inspections – to keep parts within tight specification limits. However, if the measurement system is unsuitable and the amount of measurement error exceeds the allowable tolerance, it may incorrectly overlook and accept bad parts and/or reject good parts. Consequently, a company’s ability to comply with evolving standards, participate in product and process innovation, and remain competitive in modern markets are all contingent upon highly accurate measurement system performance.

ContourX-500

Bruker Nano Surfaces and Metrology

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.

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