ResourceSpectroscopy

nanoIR3 nanoscale IR spectroscopy

27 Jun 2023

Atomic force microscopy-based infrared spectroscopy (AFM-IR) uses an AFM probe to locally detect sample thermal expansion from the absorption of infrared radiation. Thus, it can uniquely provide infrared (IR) spectroscopy and chemical analysis imaging capabilities with the high spatial resolution of AFM, breaking the diffraction limit associated with IR spectroscopy and directly correlating to FTIR techniques. In this application note from Bruker, explore the new Anasys nanoIR3, the latest generation nanoscale IR spectroscopy, chemical imaging, and materials property mapping system available today for materials and life science applications. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

Anasys nanoIR3

Bruker Nano Surfaces and Metrology

The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

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Infrared / IR SpectroscopyInfrared (IR) spectroscopy measures the interaction of infrared light with a sample, including transmission, reflectance & absorbance, facilitating the identification of analytes. Equipment used for quantitative analysis includes Fourier-transform infrared (FTIR) spectrometers, infrared cameras, FTIR gas analyzers, as well as attenuated total reflectance (ATR) accessories and pellet or film presses. Find the best IR spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SpectroscopySpectroscopy is a technique that analyzes the interaction of light with matter to study molecular properties, concentrations, and structural information. Widely used in chemical, pharmaceutical, and environmental analysis, spectroscopy offers insights into molecular composition and helps identify unknown compounds. It plays a key role in quality control, research, and diagnostics. Browse our peer-reviewed product directory to compare spectroscopy tools, read reviews, and get prices directly from manufacturers.AFMInfrared