Multimodal correlative imaging of microplastics

ZEISS presents a study on multimodal correlative imaging of microplastics. The study discusses the detection and identification of microplastics in various environments and the challenges associated with their small sizes. It focuses on the benefits of combining scanning electron microscopy (SEM) and Raman microscopy for improved analysis. A particle identification method based on machine learning software is also introduced. Additionally, the use of the nanoGPS chip for accurate sample registration and the ZEN Connect software for data processing and correlation are discussed. ZEISS concludes by highlighting the advantages of the SEM-Raman correlation and the potential of machine learning-based particle identification for microplastic analysis.