X-Ray Diffraction and Spectroscopy > X-Ray Diffractometers Products & Reviews

Highly accurate, fast compact XRD system

Unrivalled data quality from a laboratory XRD system

X-ray diffraction (XRD) is one of the most important non-destructive tool to analyze all kinds of matter ranging from fluids, to powders, to perfect crystals. 

New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research,…

D5000 – the first X-ray diffractometer with fully automated beam path

X-ray Powder Diffraction on Desktop

A complete tabletop powder X-ray analyzer

The intelligent diffractometer

SAXSpace is a new nanostructure analyzer for small- and wide-angle X-ray scattering (SWAXS) studies of nanostructured materials. With its easy handling and push-button alignment, SAXSpace is ideally suited for routine SWAXS analysis and quality control applications. SAXS experts benefit from the spacious sample chamber and versatile sample stages, allowing for full experimental flexibility. This makes SAXSpace an ideal tool fo…

D8 ADVANCE – The Industry Leader Although the D8 ADVANCE is the top-selling x-ray diffractometer for powder XRD applications, its capabilities reach far into other realms of x-ray diffraction. Facilitating more than 10,000 possible combinations of different x-ray sources, x-ray optics, sample stages, and x-ray detectors, the optimal configuration can always be reached. In addition, the modular design of the D8 ADVANCE enables…

Versatile X-ray scattering platform

Optimize ore processing

Optimize the steel making process

X-ray diffractometer for ultra-fast crystal orientation.

Ultra-fast, automated crystal orientation in a compact package.

Ultra-fast, flexible crystal orientation in a compact package.

Imaging spectroscopic ellipsometer for spatially resolved thin film analysis

Imaging ellipsometer for precise thin film and surface characterization

A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku R-AXIS RAPID II is the latest member of the RAPID family of large-area curved imaging plate (IP) X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallograph…

Structural information for isotropically and anisotropically scattering particles. The S-MAX3000 pinhole SAXS camera design is available with a choice of conventional or high brilliance X-ray sources. A 3-meter, fully evacuated camera length provides both high intensity and high resolution.Coupled with a fully integrated 2-dimensional multi-wire proportional counter, the system is capable of making highly sensitive measuremen…

NANOSTAR – Synchrotron SAXS beamline design Brilliant X-ray sources are combined with innovative multi-layer optics, which provides an intense, point-like incident beam upon the sample. Thanks to the 3-pinhole collimation, the background is extremely low, which is a must for the analysis of weakly scattering samples. The VÅNTEC-2000 is a large 2-D detector with true photon counting ability, featuring a maximum performance in a…

Process and Quality under Control

Small angle X-ray scattering (SAXS) Kratky camera system  

Multipurpose X-ray diffraction system with built-in intelligent guidance  

The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing floor. With this in mind, the MiniFlex XpC allows you to process more samples faster, and to gain greater control over your process t…