D8 ADVANCE
D8 ADVANCE – The Industry Leader Although the D8 ADVANCE is the top-selling x-ray diffractometer for powder XRD applications, its capabilities reach far into other realms of x-ray diffraction. Facilitating more than 10,000 possible combinations of different x-ray sources, x-ray optics, sample stages, and x-ray detectors, the optimal configuration can always be reached. In addition, the modular design of the D8 ADVANCE enables…
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Great results and easy to access.
Crystallography
First in class in the segment of diffractometer for the structure study!
Review Date: 10 Apr 2024 | Bruker AXS Inc.
Great instrument
Material Science
Best result obtained for the structure determination
Review Date: 26 Oct 2023 | Bruker AXS Inc.
Great Instrument - has been using it for years and still operational
Qualitative and quantitative analyses of various crystalline materials
The diffractometer is easy to use. It has an option of analysing solid block with easy configuration changes. The accompanying Eva qualitative phase analysis software is very good compared with other pakcages.
Review Date: 28 Jun 2023 | Bruker AXS Inc.
Very good instrument
Stucture evaluation
The D8 ADVANCE is very good instrument based on the unique D8 diffractometer family platform and is perfectly designed for all X-ray powder diffraction and scattering applications including: traditional X-ray powder diffraction (XRD) Pair Distribution Function (PDF)analysis. It is really an use full instrument for a material scientist.
Review Date: 22 Mar 2023 | Bruker AXS Inc.
Very interesting equipment and I like a company that offers more information about it.
Analyze of Clay
Number 1 in x-ray analysis, the use is complicated for beginners, updates of the database are so expensive, the price is expensive, but the equipment gives great results.
Review Date: 16 Jan 2023 | Bruker AXS Inc.
D8 ADVANCE – The Industry Leader
Although the D8 ADVANCE is the top-selling x-ray diffractometer for powder XRD applications, its capabilities reach far into other realms of x-ray diffraction. Facilitating more than 10,000 possible combinations of different x-ray sources, x-ray optics, sample stages, and x-ray detectors, the optimal configuration can always be reached. In addition, the modular design of the D8 ADVANCE enables an easy and straightforward change of configuration. The analytical capabilities can be expanded or simplified. A simple system can be purchased now and upgraded later, allowing for a perfectly cost-efficient x-ray diffraction system.
The push-plug optics of the D8 ADVANCE enables a quick switch between the para-focusing Bragg-Brentano geometry to parallel beam geometry without realignment of the system. For the “cut above” standard powder diffraction, the D8 ADVANCE with Vario1 Johansson focusing monochromator features high-flux K-alpha-1 radiation for reflection as well as for foil or capillary transmission experiments.
D8 ADVANCE - Sample stage concept
The sample stage concept of the D8 ADVANCE allows for many different sample environments. These range from 10 K Helium closed-cycle cryostats up to non-ambient sample conditions with high temperature and humidity. For ambient conditions, the flip-stick sample stage and the auto changer provide the capability of measuring a batch of up to 90 samples in transmission as well as in reflection geometry.
Detector technology is an important core competence of Bruker AXS. This means that the D8 ADVANCE can be equipped with the full range of point and linear detectors. According to the analytical requirements, the user can choose between different types of dynamic scintillation counter, energy dispersive Sol-X, or the Super Speed VÅNTEC-1.
No matter how the individual diffraction solution is configured, any D8 ADVANCE has the ability to perform a full range of applications, from qualitative and quantitative phase identification, under ambient or non ambient conditions, to crystal structure solution from powder samples, crystallite size determination, micro strain analysis, residual stress analysis, and preferred orientation.
