MiniFlex Benchtop XRD
New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research,…
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Simple, results comparable with big diffractometers
ceramics, polymers, carbons composite powders
Purchased for broad spectrum of users from students to experts, usable for industry experiments of large number of samples and/or students work samples variable materials. Diffractometer is easy to use, has many holders options . With database comfortable phase evaluation of materials patterns.
Review Date: 27 Jun 2023 | Rigaku Corporation
Results are reliable and very sharp peaks are obtained
Analysis of char prepared from Carbonisation of Waste Plastic
The results are good and the software smart lab provided by the company is very easy to handle and efficient. The peak matching process is very good and more over the results can be interpreted easily once they are processed by the software.
Review Date: 25 Jun 2023 | Rigaku Corporation
New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification.
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview:
- New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements:
- Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options:
- 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
