Atomic Force Microscopy / Scanning Tunneling Microscopy Products & Reviews

A new chapter in High-Speed AFM: Molecular dynamics in real-time at 50 frames per second

Nanoscale chemical analysis combining atomic force microscopy and infrared spectroscopy

Compact research-grade AFM for versatile nanoscale surface analysis

Advanced AFM system for high-precision nanoscale surface characterization

Versatile research-grade AFM for advanced nanoscale surface analysis

High-vacuum AFM for controlled-environment nanoscale surface analysis

Compact research AFM for high-resolution nanoscale surface imaging

Advanced research AFM for high-resolution surface and materials analysis

Automated AFM for fast, accurate nanoscale imaging

Based on the popular Keysight 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price. The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners, STM scanner…

Regardless of sample size, the Keysight 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM & STM scanner. The 5600LS utilizes a fully addressable 200mm x 200mm stage and a new, low-noise design. Samples up to 8”…

The Keysight 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical microscope. The system’s advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images. The Keysight 5500 ILM offers unparalleled performance an…

ICnano® provides a simple, robust and reliable system for scanning ion conductance microscopy (SICM) - the ideal technique for high resolution imaging of: • living cell membranes • soft or fragile surface features • any surface, whether organic or inorganic, that is immersed in electrolyte The ICnano® is ionscope's first product based on modulated probe ion conductance scanning - developed with a team at Imperial College Londo…

World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microsc…

Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which re…

Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers. The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allo…

Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Ed…

The BioScope Catalyst™ BioAFM is designed specifically to best answer the unique requirements of biologists, biophysicists, and bioengineers. It combines top AFM performance with unprecedented simplicity for research applications where tight integration of AFM with light microscopy is enabling tomorrow’s new discoveries.The Catalyst incorporates all of Bruker's latest PeakForce Tapping™ innovations, including the new Nanomech…

The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.

Scanning nitrogen-vacancy magnetometry

Bruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. 

The JPK NanoWizard V ® combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters open new possibilities for long-term, self-regulating experiment series.

The ForceRobot ® 400 BioAFM incorporates a number of unique force spectroscopy innovations to measure forces at the single-molecule level. As forces play a crucial role in molecular mechanisms, such as recognition and signaling, this BioAFM is uniquely suited for emerging life science research. It enables the quantification of the mechanical strength of individual molecular bonds and the characterization of the force-dependen…

The Keysight 5500 AFM/SPM microscope offers numerous unique features, such as patented top-down scanning and unrivalled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with our unique sample plates designed for your application includi…

Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating. Tip Specification Sharpened Microlevers Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm…