Dimension Icon Atomic Force Microscope

Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers.

The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.

The Icon is also equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level. The Icon’s uncommon ease of use, ultimate performance, exceptional productivity, and superior versatility make it an ideal choice for practically every AFM application.


Dimension Icon Atomic Force Microscope Features:

• Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on large-sample AFMs
• Significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in TappingMode™
• Drift rates less than 200pm per minute render distortion-free images
• Integrated feedback alignment tools deliver quick and optimized probe positioning
• High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
• ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings
• Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
• Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques
• Custom user-programmable scripts offer semi-automated measurement and analysis