Park FX40 AFM
Automated AFM for fast, accurate nanoscale imaging
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The Park FX40 Atomic Force Microscope is a high-performance AFM designed for researchers who require reliable, high-resolution nanoscale imaging with fast throughput. Built on Park Systems’ non-contact AFM technology, the FX40 delivers accurate topographical and material property measurements while minimizing tip and sample damage.
The system supports a wide range of AFM modes, enabling detailed surface characterization across diverse materials. Its rigid mechanical design and advanced vibration isolation ensure stable imaging performance, even for challenging samples. The FX40 is well suited for both routine measurements and advanced research applications in materials science, nanotechnology, and semiconductor research.
Key Features:
- Non-contact AFM technology for accurate measurements
- High mechanical stability for repeatable imaging
- Broad support for imaging and property-mapping modes
- User-friendly software for efficient operation
