ArBlade 5000 II/IM5000 II-CTC
High-performance Ar+ ion polisher
The supplier does not provide quotations for this product through SelectScience. You can search for similar products in our Product Directory.
"ArBlade 5000 / IM5000 extends the cross-sectioning capabilities of the IM4000 II series with the option of expanding cross-sections to a width of up to 10 mm, depending on actual requirements. For this purpose, the sample is periodically moved laterally during cross-cutting in the previously registered processing area while remaining in the optimum focus. Sequential processing of several individual positions is also possible as an option; the optional multiple sample holder allows automatic processing of up to 3 samples.
The ArBlade 5000 / IM5000 is equipped with a more powerful ion gun with a removal rate of over 1mm per hour. With the ArBlade 5000-CTC, cryo cross-sections of variable widths are also possible at definable process temperatures down to -100 °C.
Product features:
- Single, robust and maintenance friendly Penningtype ion gun with independent control of beam current and acceleration voltage. Allows intensive ion beams at all acceleration voltages (0-8kV)
- Cross-section widths can be flexibly selected by periodically moving the sample relative to the ion beamfrom 1 mm to 10 mm wide
- Cross-sectional process depth in Si with 100µm protrusion above mask, stage oscillation +/-30°, is 1000µm per hour or more
- Surface polishing can be carried out at tilt angles from 0° to 90°, angle can be changed during the process"
Brochures
ArBlade 5000 ion milling system
Explore the ArBlad 5000 from Hitachi, an advanced broad ion beam system for producing high-quality cross-section or flat-milling samples for electron microscopy. The ArBlade 5000 is equipped with a fast-milling Ar ion gun with a milling rate twice as high for cutting-edge performance, thus dramatically reducing the processing time for cross-section preparation.
Hitachi Product Catalogue 2024/25- German
In this brochure, Hitachi High-Technologies present a wide range of electron microscopes and ion beam systems available, organised by product class, in German. Each tool is designed to reliably meet your application needs.
Hitachi Product Catalogue 2024/25- English
In this brochure, Hitachi High-Technologies present a wide range of electron microscopes and ion beam systems available, organised by product class. Each tool is designed to reliably meet your application needs.
Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000
In this application note, Hitachi High-Tech Europe has compiled answers to some of the frequently asked questions, to help you decide whether ion milling is the right solution for your lab.
Optimizing SEM sample preparation with broad ion beam milling
In this application note, Hitachi High-Tech Europe has compiled answers to some of the frequently asked questions, to help you understand how ion milling can enhance your SEM workflow.
ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM
Often, conventional mechanical sample preparation techniques for scanning electron microscopy (SEM) can deliver usable results on some specimens. However, they can also fail, especially when it comes to composites and layered structures with different hardness, brittle materials, and so forth. Explore the power of broad ion beam milling methods and how the Hitachi ArBlade 5000 – a broad ion beam system – produces exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
What is Ar ion beam milling?
Discover the two types of Argon ion (Ar) milling: cross section and flat milling. Understand the individual advantages each can provide and how they can accurately prepare samples for scanning electron microscopy (SEM) to produce precise and artifact-free images. Plus, explore the Ion Milling System ArBlade 5000, an advanced broad ion beam system for producing high-quality cross-section or flat-milling samples for electron microscopy.
