ResourceGeneral Lab
ArBlade 5000 ion milling system
5 Mar 2025Explore the ArBlad 5000 from Hitachi, an advanced broad ion beam system for producing high-quality cross-section or flat-milling samples for electron microscopy. The ArBlade 5000 is equipped with a fast-milling Ar ion gun with a milling rate twice as high for cutting-edge performance, thus dramatically reducing the processing time for cross-section preparation.
Related products
Request Quote for All Products
Links
Tags
Mills, Sieves and PressesMills, sieves and presses are used to break and sort solid materials into smaller particle sizes for further processing such as pellet pressing or analysis. Milling equipment includes grinders, ball mills, cutting mills, jaw crushers, knife mills, beater and planetary mills. Sorting of smaller particulates can be achieved with test sieves and sieve shakers. Final powders can be pressed with hydraulic presses. Milling and pressing solid samples is an important preparation step in X-ray fluorescence spectroscopy (XRF) and diffraction (XRD). Find the best mills, sieves and presses in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.Argon