High-resolution EDS analysis enabled by ZEISS GeminiSEM
13 Apr 2023
In this video from ZEISS, the benefits of variable pressure (VP) mode and NanoVP mode are discussed. The beam sleeve in the VP mode enables the electron beam to travel only a short distance in the low vacuum region, reducing the skirting effect. The NanoVP mode on ZEISS field emission scanning electron microscopes (FE-SEMs) improves image quality in variable pressure mode, enhancing resolution and signal collection.
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ZEISS Research Microscopy Solutions
As the world's only manufacturer of light, X-ray and electron/ion microscopes, ZEISS offers tailor-made microscope systems for your life sciences and materials research, education and clinical routine. A well-trained sales force, an extensive support infrastructure and a responsive service team enable customers to use their ZEISS microscopes to their full potential. Highly skilled and well trained application specialists support your work and make sure you get the most out of your investment.
