Preparative Ion Milling / Polishing Products & Reviews
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Preparative Ion Milling / Polishing
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PIPS II System
Gatan Inc.Precision ion polishing system for precise centering, control, and reproducibility of your milling process.
IM4000 Ion Milling System
Hitachi High Technologies America, Inc.The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine…
EM TIC 3X Ion Beam Milling System
Leica Microsystems EuropeThe Triple Ion Beam Cutter, EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
Model 1040 NanoMill® TEM specimen preparation system
E.A. Fischione Instrumental Inc.Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…
Automatic Twin-Jet Electropolisher
E.A. Fischione Instrumental Inc.High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…
Ilion II System
Gatan Inc.Ideal for low energy surface preparation for your SEM cross section viewing.
EM TXP Target Surfacing System
Leica Microsystems EuropeThe EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.