Hitachi High-Tech Europe Materials Products & Reviews

High-Resolution Schottky VP FE-SEM

High-performance Ar+ ion polisher

FIB-SEM optimised for large-volume 3D examinations

The fully digital TEM / STEM for all applications, available in 3 models

Compact SEM with low vacuum function

Standard Ar+ cross-section and surface polisher

High-Resolution FE-SEM with Cold Field Emitter

FIB-SEM for the semiconductor sector with 200mm wafer coverage

FIB-SEM for the highest demands on TEM samples

High-Resolution and Analytical Schottky VP FE-SEM with Large Sample Chamber

Modular VP-SEM platform, available with two different sample chambers and two types of electron optics

Inlens FE-SEM and STEM

60-200kV ETEM with maximum resolution