SU8700
High-Resolution Schottky VP FE-SEM
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Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample chamber can be opened and evacuated again in a matter of minutes to insert accessories. The sample stage can be moved 110mm in X and Y directions. An integrated colour camera enables image-based navigation. There are plenty of connection options for 2 x EDX, EBSD, STEM, inert gas sample transfer, plasma cleaner and other accessories are available.
Product features:
- Durable and stable Hitachi Schottky field emitter with up to 200nA probe current
- Brilliant imaging performance - without the need for a decelerating field on the sample - from 100V (10V option) up to 30kV acceleration voltage. EDX analysis and high-resolution imaging with all detectors are possible at 6mm working distance
- Reliable automatic functions such as adaptation to user defined optical conditions or 2D autofocus and autostigmator enable practical use of the superior equipment capabilities
- A 150mm diameter sample airlock is supplied as standard. It enables fast specimen exchange while keeping the chamber vacuum clean
Brochures
Hitachi Product Catalogue 2024/25- German
In this brochure, Hitachi High-Technologies present a wide range of electron microscopes and ion beam systems available, organised by product class, in German. Each tool is designed to reliably meet your application needs.
Hitachi Product Catalogue 2024/25- English
In this brochure, Hitachi High-Technologies present a wide range of electron microscopes and ion beam systems available, organised by product class. Each tool is designed to reliably meet your application needs.
Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs
In recent decades, the Field Emission SEM (FE-SEM) has emerged as a lynchpin of analytical science, providing professionals in nearly every scientific and engineering field with several benefits over conventional SEMs and allowing them to understand a plethora of complex processes and emerging technologies. In this application note, Roland Schmidt, Senior Applications Specialist at Hitachi, discusses this innovative technology and Hitachi’s range of FE-SEM microscopes.
