Study Biological Dynamics with the New Dimension FastScan From Bruker
11 Jan 2013
In this video Andrea Slade, an Applications Specialist at Bruker-Nano, tells SelectScience how the new Dimension FastScan is helping researchers to overcome the current limitations associated with Atomic Force Microscopy (AFM). With this new technology researches can now study biological dynamics, for example cell migration. As its name suggests the Dimension FastScan enables faster scanning, which not only results in high spatial resolution, but also in high temporal resolution. Interview filmed by SelectScience at ASCB 2012.
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Bruker Nano Surfaces and Metrology
Bruker Nano Surfaces and Metrology provides industry-leading surface and dimensional analysis tools, including AFMs, tribometers and mechanical testers, nanomechanical and nanotribological test instruments, and AFM-IR (nanoIR) technology. Whatever you material or scale of investigation, our broad range of surface analysis instruments can be used to provide solutions for R&D, QA/QC, and failure analysis with speed, accuracy, and ease. Visit www.bruker.com/nano for more information.
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Dimension FastScan™
Bruker Nano Surfaces and MetrologyWorld's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.Dimension FastScan™ Features: Work hundreds of times faster with fast scanning rates up to frames per second, automated laser and detector alignment, comprehensive work flow and smart engaging Built-in measurement automation software in conjunction with higher speed ScanAsyst® provide exceptional measurement confidence and repeatability Precise force control at the tip renders high resolution and long tip-life Low-noise, temperature-compensated sensors in the scanners maintain sub-nanometer noise levels Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift Sample from subnanometer to hundreds of nanometers in height without loss of resolution
