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White Papers

Study of Helium Ion Beam Exposed Nanostructures by <i>In Situ</i> AFM with ZEISS MERLIN

20 Jan 2015

Scientific Poster

X-Ray TDI Camera: Lithium Ion Batteries

19 Jan 2015

White Papers

ChemiSTEM Technology: A Revolution in EDX Analytics

19 Jan 2015

Scientific Poster

Using the X-Ray TDI Camera to Analyze Printed Circuit Boards

13 Jan 2015

White Papers

Minimizing the Beam Skirt Effect in X-Ray Microanalysis of Nonconductive Samples

13 Jan 2015

Application Note

X-Ray Line Scan Camera: Medical Applications

6 Jan 2015

Application Note

Imaging of Nano-Carbon Samples with Combined Raman-AFM, SNOM, Nearfield-Raman, and Raman-SEM

6 Jan 2015

Application Note

Fast Screening of Flame Retardants and Plasticizers in Plastics of Electronic Products

5 Jan 2015

Application Note

Analysis of Mineral Content in Milk Powder

5 Jan 2015

Case Study

Tracking Changes in Asphalt Microstructure Resulting from Traffic

2 Jan 2015

White Papers

Insulator Deposition Induced by Gas Field Ion Source (GFIS) Column: Ultrahigh Resistivity and High Resolution with ZEISS ORION NanoFab

2 Jan 2015

Application Note

Atomic Force Microscopy - Temperature Dependent Properties of Polymers

30 Dec 2014

Application Note

Textile Check for Spin Finish Removal

24 Dec 2014

Application Note

Confocal Raman Microscopy – Semicrystalline Polypropylene Film

18 Dec 2014

Application Note

Sulfur and Ultra-Low Chlorine in Crude Oil

18 Dec 2014

Case Study

Quality Control in the Production of High-Quality Plastic Parts

17 Dec 2014

White Papers

<i> In Situ</i> & 4D Science: Observing and Quantifying the Evolution of 3D Microstructure

17 Dec 2014

Application Note

High Absorbance Scanning with the PerkinElmer LAMBDA 850 UV/Vis and LAMBDA 950/1050 UV/Vis/NIR Spectrophotometers

15 Dec 2014

Application Note

Analysis of Aluminum Alloys

10 Dec 2014

Application Note

Dip on Fibers Elastomer Coating on Fibers

10 Dec 2014

Application Note

High Resolution Accurate Mass Selectivity with Confidence for Routine Applications

10 Dec 2014

Application Note

Analysis of Major and Minor Elements in Cement Fused Beads

5 Dec 2014

White Papers

Rising Above the Helium Shortage

5 Dec 2014

Application Note

Improving the Identification and Measurement of Trace Odorous and Toxic Components during Materials Emissions Testing

5 Dec 2014

Application Note

Reproducibility of Crude Oil Characterization by Flow Injection APPI-FT-ICR Mass Spectrometry

5 Dec 2014

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Selected Filters:

Study of Helium Ion Beam Exposed Nanostructures by <i>In Situ</i> AFM with ZEISS MERLIN

X-Ray TDI Camera: Lithium Ion Batteries

ChemiSTEM Technology: A Revolution in EDX Analytics

Using the X-Ray TDI Camera to Analyze Printed Circuit Boards

Minimizing the Beam Skirt Effect in X-Ray Microanalysis of Nonconductive Samples

X-Ray Line Scan Camera: Medical Applications

Imaging of Nano-Carbon Samples with Combined Raman-AFM, SNOM, Nearfield-Raman, and Raman-SEM

Fast Screening of Flame Retardants and Plasticizers in Plastics of Electronic Products

Analysis of Mineral Content in Milk Powder

Tracking Changes in Asphalt Microstructure Resulting from Traffic

Insulator Deposition Induced by Gas Field Ion Source (GFIS) Column: Ultrahigh Resistivity and High Resolution with ZEISS ORION NanoFab

Atomic Force Microscopy - Temperature Dependent Properties of Polymers

Textile Check for Spin Finish Removal

Confocal Raman Microscopy – Semicrystalline Polypropylene Film

Sulfur and Ultra-Low Chlorine in Crude Oil

Quality Control in the Production of High-Quality Plastic Parts

<i> In Situ</i> & 4D Science: Observing and Quantifying the Evolution of 3D Microstructure

High Absorbance Scanning with the PerkinElmer LAMBDA 850 UV/Vis and LAMBDA 950/1050 UV/Vis/NIR Spectrophotometers

Analysis of Aluminum Alloys

Dip on Fibers Elastomer Coating on Fibers

High Resolution Accurate Mass Selectivity with Confidence for Routine Applications

Analysis of Major and Minor Elements in Cement Fused Beads

Rising Above the Helium Shortage

Improving the Identification and Measurement of Trace Odorous and Toxic Components during Materials Emissions Testing

Reproducibility of Crude Oil Characterization by Flow Injection APPI-FT-ICR Mass Spectrometry

Resources

Resources FilterResources Filter

Search

Selected Filters:

Study of Helium Ion Beam Exposed Nanostructures by <i>In Situ</i> AFM with ZEISS MERLIN

X-Ray TDI Camera: Lithium Ion Batteries

ChemiSTEM Technology: A Revolution in EDX Analytics

Using the X-Ray TDI Camera to Analyze Printed Circuit Boards

Minimizing the Beam Skirt Effect in X-Ray Microanalysis of Nonconductive Samples

X-Ray Line Scan Camera: Medical Applications

Imaging of Nano-Carbon Samples with Combined Raman-AFM, SNOM, Nearfield-Raman, and Raman-SEM

Fast Screening of Flame Retardants and Plasticizers in Plastics of Electronic Products

Analysis of Mineral Content in Milk Powder

Tracking Changes in Asphalt Microstructure Resulting from Traffic

Insulator Deposition Induced by Gas Field Ion Source (GFIS) Column: Ultrahigh Resistivity and High Resolution with ZEISS ORION NanoFab

Atomic Force Microscopy - Temperature Dependent Properties of Polymers

Textile Check for Spin Finish Removal

Confocal Raman Microscopy – Semicrystalline Polypropylene Film

Sulfur and Ultra-Low Chlorine in Crude Oil

Quality Control in the Production of High-Quality Plastic Parts

<i> In Situ</i> & 4D Science: Observing and Quantifying the Evolution of 3D Microstructure

High Absorbance Scanning with the PerkinElmer LAMBDA 850 UV/Vis and LAMBDA 950/1050 UV/Vis/NIR Spectrophotometers

Analysis of Aluminum Alloys

Dip on Fibers Elastomer Coating on Fibers

High Resolution Accurate Mass Selectivity with Confidence for Routine Applications

Analysis of Major and Minor Elements in Cement Fused Beads

Rising Above the Helium Shortage

Improving the Identification and Measurement of Trace Odorous and Toxic Components during Materials Emissions Testing

Reproducibility of Crude Oil Characterization by Flow Injection APPI-FT-ICR Mass Spectrometry

Resources Filter