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A new class of atomic force microscope: FX40, the automatic AFM
6 Sept 2021This technical note demonstrates the innovative design, ease of operation, and superior imaging capabilities of the new Park FX40. This automatic Atomic Force Microscope (AFM) system is designed to acquire high-quality images fast, using novel features such as machine learning and pattern recognition, QR-code based tip selection, and fully automatic tip exchange and alignment. This technical note describes the imaging process from beginning to end and illustrates it with real-world application examples.
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Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Surface Area TestingPhysisorption studies fundamental parameters essential for the characterization of materials such as the specific surface area and pore size distribution. Properties such as porosity, strength, hardness, permeability, separation selectivity, corrosion, and thermal stress resistance can all be directly correlated to the porous structure of a material.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MetrologyMicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.Surface AnalysisNanomaterialsNanomaterials such as carbon nanotubes, fullerenes and nanoparticles are a group of materials that measure between 1-1000nm for a single unit. Analysis techniques include AFM, electron microscopy and super resolution microscopy.