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ProductsSpectroscopy

Epsilon 1 range

Malvern Panalytical

Epsilon 1 makes elemental analysis easy - a fully integrated energy dispersive XRF analyzer, built-in computer and a touch screen, offering  pre-calibrated  solutions with guaranteed performance. Epsilon 1 is fast and cost-effective, delivering precise and accurate data, ease of use, and easy sample prep, and low cost of ownership.

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ProductsSpectroscopy

S1 TURBO SD

Bruker AXS Inc.

S1 TURBO SD Handheld XRF Spectrometer So what makes the S1 TURBO SD such an important innovation in this field? The key is the XFlash® Silicon Drift Detector, which offers count rates and resolution far superior to traditional SiPIN detector technology. This results in even faster analysis – 2-3 second grade ID’s and 5 seconds for elemental chemical analysis (excluding light elements). That’s about five times faster than previ…

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ProductsSpectroscopy

Rigaku NEX QC: Low Cost Elemental Analyzer

Rigaku Corporation

As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control applications. Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen inter…

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ProductsSpectroscopy

NEX XT Process Sulfur Gauge

Rigaku Corporation

Rigaku's NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.This versatile, compact and robust X-ray Transmission / Absorption (XRT / XRA) process gauge is specifically optimized for the total sulfur analysis needs of refineries, pipelines, blending operations, bunkering terminals and ot…

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ProductsSpectroscopy

MicroXR Microbeam XRF Platform

Thermo Fisher Scientific

Microbeam X-ray fluorescence (µXRF) is a revolutionary new approach to film thickness determination. Using a focused x-ray beam energy source, MicronX measures the thickness and composition of up to six layers of deposited metals simultaneously, from angstrom to micron thickness ranges.Product detail:The MicroXR platform of thin film measurement systems combine X-ray fluorescence (XRF), a non-contact, non-destructive spectrosc…

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