Electron Microscopy Products & Reviews

Ion Beam Cross Section Polisher (CP) 

Field Emission Auger Microprobe

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.

This system delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining. Featuring an innovative, fully integrated femtosecond laser, it offers the fastest material removal rate with the highest cut face quality.

Large area image acquisition

This device is dedicated to precious metal thin film coating for SEM observation.

High-pressure freezing with the possibility of light and electrical stimulation

Combining the X-ray peak resolution power of WDS with the speed of EDS, AZtecWave is a software solution that allows users with all levels of expertise to quantify minor and trace elements with ease.

The EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

Developed in cooperation with leading scientists, the EM ACE coater family covers all the requirements for your sample preparation needs, from coating to freeze fracture. 

Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

Component cleanliness analysis with a multi-purpose desktop SEM.

SEM EDX gunshot residue analysis (GSR analysis) with desktop SEM.

Scanning nitrogen-vacancy magnetometry

Desktop SEM for robust and effortless SEM analysis, expanding your research capability.

Desktop SEM with EDS capability for robust, effortless, and versatile elemental and SEM analysis.

Economical desktop SEM with advanced, easy to use features.

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization.

High throughput TEM and STEM microscope for all materials science applications.

High resolution TEM and STEM microscope for all materials science and semiconductor applications.

Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.

in situ Transmission Electron Microscope

Leica's cryo-electron tomography workflow solution: boost your productivity with a seamless sample preparation workflow.