JPK Instruments Products & Reviews

New standards for soft matter and life science AFM Most stable platform for highest resolution in imaging and force measurements Stand-alone tip scanning design for flexibility in the applications Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...) Patented DirectOverlay™ software feature for combining AFM and o…