Products & Review
NanoWizard II
New standards for soft matter and life science AFM Most stable platform for highest resolution in imaging and force measurements Stand-alone tip scanning design for flexibility in the applications Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...) Patented DirectOverlay™ software feature for combining AFM and o…
The supplier does not provide quotations for this product through SelectScience. You can search for similar products in our Product Directory.
Description
- New standards for soft matter and life science AFM
- Most stable platform for highest resolution in imaging and force measurements
- Stand-alone tip scanning design for flexibility in the applications
- Fits to all standard inverted research microscopes from Zeiss, Leica, Olympus and Nikon
- Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...)
- Patented DirectOverlay™ software feature for combining AFM and optical images distortion free
- In-situ imaging in biological/chemical fluids or in air
- Measurements at variable temperatures with perfusion possibilities
- Large scan field of 100×100×15 µm3 with highest closed loop performance through capacitive sensors


