Bruker Nano Surfaces and Metrology Materials Products & Reviews

A new chapter in High-Speed AFM: Molecular dynamics in real-time at 50 frames per second

The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microsc…

Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which re…

Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers. The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allo…

Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Ed…

The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.

Bruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. 

The JPK NanoWizard V ® combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters open new possibilities for long-term, self-regulating experiment series.

Bruker’s large-sample Dimension IconIR system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-b…

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.…

The Hysitron PI 89 SEM PicoIndenter leverages the advanced imaging capabilities of scanning electron microscopes (SEM, FIBSEM, PFIB), making it possible to perform quantitative nanomechanical testing while simultaneously imaging. Enabled testing techniques include nanoindentation, tensile testing, pillar compression, particle compression, cantilever bending, fracture, fatigue, dynamic testing, and mechanical properties mappin…

The Hysitron TI 980 nanoindenter achieves remarkable advances in control and throughput capabilities, testing flexibility, applicability, measurement reliability, and system modularity. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization. 

The DektakXT stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4 Å and up to 40% improvement in scanning speeds. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

FilmTek SE automated benchtop spectroscopic ellipsometer enables highly precise, repeatable film thickness, refractive index, and extinction coefficient measurements on a range of thin and ultra-thin film samples. This budget-friendly ellipsometer is ideally suited for use in academic and R&D settings investigating the thickness and uniformity of ultra-thin films.

We offer a wide selection of AFM tips of various shapes, tip geometries, materials and coatings, spring constants, frequencies, etc. to fit your specific application. Whether we are manufacturing probes for the budget-conscious shopper or high-end performance applications, meeting a high standard of quality is priority to us. Our dedication to manufacturing probes, coupled with our expertise in AFM, ensures that we are unique…

The ForceRobot ® 400 BioAFM incorporates a number of unique force spectroscopy innovations to measure forces at the single-molecule level. As forces play a crucial role in molecular mechanisms, such as recognition and signaling, this BioAFM is uniquely suited for emerging life science research. It enables the quantification of the mechanical strength of individual molecular bonds and the characterization of the force-dependen…