NORAN System 7 X-ray Microanalysis System

Spectral Analysis

Identifies elemental peaks quickly and accurately using rule-based identification and peak shape deconvolution
SpectraCheck both visually and statistically confirms the presence of an element using spectrum simulation and comparison routines—provides both an overlapped spectrum and a chi-squared value indicating goodness of fit
Elemental peak references provide a complete set of spectral peak shapes collected with a typical EDS system
The intensities from these shapes are automatically corrected to match the microscope detector—eliminates the need for periodic calibration of the system with standards
Uses the PROZA Phi-Rho-Z matrix correction algorithm

Point and Shoot Mode

Integrates electron imaging and X-ray analysis
Single mouse click provides both elemental identification and quantitative analysis of the selected areas of interest of the sample
Areas on the sample are defined using points, rectangles, circles, polygon or with a magic wand tool
Magic wand tool allows easy, instant outline of complex areas without having to manually draw a border
The selection, based on gray levels, is made automatically with just one click
Selected areas may be analyzed instantly or multiple areas may be selected for automated analysis
Performs processing according to chosen settings
Able to provide the required spectral results—from qualitative analysis to quantitative analysis with full standards

Spectral Imaging

Acquires a spectrum at every point—useful for imaging, X-ray mapping, Linescan and advanced automated analysis
NORAN System 7 collects data that can be analyzed repeatedly without the need for reacquiring or changing acquisition parameters—with one click
Analyze the collected data locally at the microscope or take the data offline to a different computer for report preparation

COMPASS

Allows all of the people in the lab to perform the same analysis and obtain consistent results
Uses powerful multivariate statistical algorithms, as created by Paul Kotula et al. and licensed from Sandia National Labs
Using advanced algorithms, Direct-to-Phase extracts and displays known phases while the data is still being collected
Allow the EDS system to decide when sufficient statistics have been collected, or visualize the data as it develops

Direct-to-Phase

Data analysis concurrent with data collection - the speed of real time phase analysis
Not only presents elemental data in maps and spectra, it develops an information-rich picture of the sample composition—and it produces complete data ten times faster than current X-ray microanalysis technology