HYPERION II
HYPERION II is a high-performance FT-IR and laser imaging microscope, merging traditional FT-IR microscopy with QCL technology in one configurable research platform, offering high spatial resolution, powerful imaging options, and complete control over every measurement parameter.
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The HYPERION II empowers researchers with full experimental control through freely configurable detectors, optics, and imaging modes, ensuring every measurement is tailored to the sample and scientific objective. By unifying FT-IR and QCL technologies in one platform, it expands analytical possibilities, from broad band spectroscopy to ultrafast, diffraction limited laser imaging, without compromising workflow simplicity.
Its versatile accessory ecosystem, including temperature controlled stages, macro ATR, and universal sample holders, streamlines handling of diverse and challenging specimens. This flexibility, combined with high resolution IR imaging capabilities, delivers deeper insights into complex structures and chemical distributions. With the freedom to choose the optimal detector and optical setup for each task, the HYPERION II removes analytical barriers and elevates micro spectroscopic research across all applications.
Key features:
• Achieve diffraction-limited IR imaging with high-sensitivity focal-plane array detection.
• Easy switch between all modes: transmis¬sion, reflection, ATR, FT-IR or QCL.
• Tailor experiments with a wide selection of detectors, optics and accessories.
• Combine full-spectrum FT-IR and IR laser imaging within a single instrument.
• Reduce imaging artefacts and improve clarity with patented laser coherence control.
Relevant applications
• Microplastics, polymers, multilayer structures, and materials science imaging.
• Pharmaceutical tablet mapping, contaminant identification, and quality control.
• Biological tissue and cell imaging with ultrafast acquisition for clinical and research workflows.
• PCB cleanliness, embedded components, and precision mechanics inspection.
• Emission microscopy, spectral profiling of IR emitters, and advanced optical materials studies.
TechTalk: Advancing energy storage with spectroelectrochemistry
Thursday, February 5 at 18:00 GMT | 19:00 CET | 13:00 EST | 10:00 PST
Developing next‑generation energy storage systems demands a deeper, more precise understanding of electrochemical behavior, including how to optimize electrode composition and ensure chemical homogeneity throughout the electrode structure. Combining electrochemistry with Infrared and Raman spectroscopy offers a powerful approach for achieving these goals. Pairing these techniques with microscopy further enables micrometer-scale insights into chemical composition and distribution.
This 20-minute TechTalk will explore how these capabilities come together with four key instruments that make this integrated approach possible: INVENIO, RAMANtouch, HYPERION II and VERTEX NEO R.
Join Dr. Sergey Shilov, Senior Application Scientist, Bruker Optics, as he shares his 40+ years of FTIR and Raman knowledge to inspire and accelerate your research in batteries, fuel cells, and advanced energy materials.
Key learning objectives:
- Understand spectroelectrochemical tools and workflows for probing reactions at electrodes and within electrolytes.
- Learn how to optimize instrument setup and integration, including effective communication between potentiostats and spectrometers.
- Understand how to apply fast chemical imaging techniques to visualize electrode surfaces and reaction dynamics.
- Explore real‑world electrochemical case studies such as metal–organic complex oxidation, polymer distribution mapping, electrode degradation analysis, and SEI characterization in lithium metal batteries.
Who should attend?
- Chemists, battery engineers, and scientists who are developing new materials for energy storage.
Certificate of attendance
If you attend the live TechTalk, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes.
If you view the on-demand TechTalk, you can request a certificate of attendance by emailing editor@selectscience.net.
