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Product News

New Additions to Veeco's Dimension AFM Line at ACS 2010

16 Aug 2010

Product News

Veeco Releases Two New Breakthrough AFM Scan Modes

6 Aug 2010

Product News

Veeco Introduces the MultiMode 8 High-Performance SPM

7 Dec 2009

Product News

Veeco Introduces Dimension Icon Atomic Force Microscope Large-Sample AFM with “Small-Sample” Resolution

2 Feb 2009

VEECO Instruments Inc. | Articles