Rigaku Presents X-Ray Analytical Instrumentation Portfolio at Pittcon 2017

Visit Rigaku at Booth # 3512

7 Mar 2017

Lois Manton-O'Byrne, PhD

Executive Editor

Product news

Rigaku Corporation is pleased to announce its attendance at the 68th annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon 2017), held March 5 - 9, 2017 at McCormick Place in Chicago, IL USA. Rigaku is exhibiting its benchtop lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at Booth # 3512

Rigaku (The Woodlands, TX) is showing the Rigaku Supermini200 benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer and the Rigaku MiniFlex benchtop X-ray diffractometer.

The Rigaku Supermini200 analyzer is the world's only high-power (200 W) benchtop sequential wavelength dispersive X-ray fluorescence spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material. It uniquely delivers low cost-of-ownership with high resolution and lower limits of detection (LLD).

Ideally suited for today's fast-paced XRD analyses, the fifth generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high-speed detector coupled with a powerful 600 W X-ray source. The MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package.

Applied Rigaku Technologies (ART, Austin, TX) will feature the new Rigaku NEX DE VS direct excitation variable spot X-ray fluorescence elemental analyzer. The newest addition to the Rigaku NEX DE series of high-performance, direct excitation energy dispersive XRF (EDXRF) elemental analyzers, The NEX DE VS is uniquely suited for small spot analysis. It features a high-resolution camera combined with automated collimators allowing for precise positioning of a sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes.

For on-line elemental analysis, the ART division presents the NEX OL process elemental analyzer. The NEX OL enables real-time process elemental analysis for liquid stream applications. It is also designed to service web and coil applications, with the ability to analyze multi-element composition and/or coating thickness.

The ART division is also displaying the Rigaku NEX QC+ low-cost benchtop EDXRF spectrometer. The NEX QC+ is a compact elemental analyzer with an intuitive “icon-driven” touch screen interface and built-in printer for easy operation and convenience.

Also presenting from Rigaku Analytical Devices is Mr. Fumihito Muta of Rigaku Corporation and Dr. Yasuo Seto, Ph.D., Director of the Forensic Science National Research Institute of Police Science. The presentation titled “On-site determination of chemical warfare agents by handheld Raman with 1064 nm excitation laser” highlights use of the Rigaku Progeny handheld Raman analyzer and will be on March 8, 2017 at 10am.

Related products

Request Quote for All Products

NEX DE VS
Rigaku Corporation
Rigaku NEX DE VS High-performance, Direct Excitation Variable Spot EDXRF Elemental Analyzer
(0)
Progeny™ Handheld Raman Analyzer
Rigaku Corporation
The new generation in handheld Raman analysis that streamlines your material ID workflow. From the evolution of handheld spectroscopy arrives Progeny – the first handheld Raman analyzer designed to be customizable and flexible for seamless integration into any work environment. Now you can perform lab-quality analysis of the widest range of solids, powders, liquids, and other substances to ensure consumer safety around the globe.Progeny provides the power of Raman spectroscopy in a handheld form with no compromises. You are empowered to choose the complexity of the task at hand. Its unique software design provides articulate communication of simple PASS/FAIL decision or more detailed analysis results for a variety of applications in the lab, in the field, or wherever you need data.Progeny™ Handheld Raman Analyzer Features: Accurately analyze your materials through packaging Minimize the learning curve with a smartphone-inspired interface Increase confidence in your material ID with unparalleled sensitivity Measure a wide range of materials with interference-free data Expand your data transfer flexibility (LIMS, wireless, and docking station)
(5)
MiniFlex Benchtop XRD
Rigaku Corporation
New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case
(11)
Supermini 200 Benchtop WDXRF Spectrometer
Rigaku Corporation
The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD). Not only is the Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. The Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.Supermini is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.Supermini 200 Benchtop WDXRF Spectrometer Features: Analyze oxygen through uranium (O → U) Analyze: solids, liquids, powders, alloys and thin films Atmosphere: air, helium or vacuum X-ray tube: 50 kV, 200 W Pd-anode Primary beam filter: Zr is standard; Al optional Detectors: F-PC and scintillation Crystals: 3-position changer Autosampler: 12-position standard Vacuum: rotary pump standard Power: 100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A
(0)
NEX QC+ EDXRF Analyzer
Rigaku Corporation
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).NEX QC+ Features: Analyze 11Na to 92U non-destructively Solids, liquids, alloys, powders and thin films 50kV X-ray tube for wide elemental coverage SDD detector for superior resolution and sensitivity Modern smartphone style "icon driven" user interface Multiple automated tube filters for enhanced sensitivity Convenient built in thermal printer Low cost with unmatched performance-to-price ratio Optional fundamental parameters
(2)
NEX OL Process Elemental Analyzer
Rigaku Corporation
On-line, real-time analysis by Energy Dispersive X-ray Fluorescence (EDXRF). Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is configurable for use in both classified and non-classified areas. Features and Benefits of NEX OL Process Elemental Analyser: Real-time process control by elemental analysis Measure elements 13Al to 92 From ppm levels to weight percent (wt%) Robust NEX QC+ optics with SDD detector Industrial touch screen user interface Easy empirical calibration and routine operation Toolless routine maintenance Multiple remote analysis heads (non-classified) No dangerous radioisotopes
(0)