Rigaku presents latest X-ray analytical technology
Rigaku is attending the 2019 Materials Science and Technology meeting to present it's latest X-ray analytical instrumentation
29 Sept 2019
Product news
Rigaku Corporation is attending the 2019 Materials Science and Technology meeting and exhibition (MS&T19), taking place at the Oregon Convention Center in Portland, OR September 29–October 3, 2019.
MS&T is an annual technical meeting and exhibition offering a forum for fostering technical innovation at the intersection of materials science, engineering, and application. Each year, it brings together scientists, engineers, students, suppliers, and business leaders to discuss current research and technical applications and to shape the future of materials science and technology.
The event's technical program addresses structure, properties, processing, and performance across the materials community. It's exhibition showcases a wide variety of equipment and services to the automotive, aerospace, instrumentation, medical, oilfield, and energy industries.
Rigaku provides the world’s most complete line of X-ray analytical equipment, including benchtop X-ray diffraction (XRD) and X-ray fluorescence (XRF) systems, X-ray optics and detectors, single crystal diffractometers for chemical crystallography, multi-purpose diffractometers with small-angle X-ray scattering (SAXS) and in-plane capabilities, and high-powered wavelength dispersive X-ray fluorescence (WDXRF) spectrometers. Rigaku is presenting its diverse range of analytical instrumentation at Booth # 625.
On display at the event is the 6th generation Rigaku MiniFlex benchtop XRD instrument. The new MiniFlex X-ray diffractometer is a multipurpose analytical instrument that can determine: phase identification and quantification, percent crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure.
The latest MiniFlex system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer.
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MiniFlex Benchtop XRD
Rigaku CorporationNew 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case