Rigaku Features Latest Analytical Instruments at Pittcon Conference and Expo

Rigaku exhibits its X-ray analytical instrumentation at booth numbers 2000-2002

27 Feb 2018
Arif Butt
Other (please specify)

Industry news

Rigaku Corporation has announced its attendance at the 69th annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon 2018), being held Monday, February 26, 2018 through Thursday, March 1, 2018 at the Orange County Convention Center in Orlando, FL USA. Pittcon is the world’s leading annual conference and exposition on laboratory science, attracting attendees from industry, academia and government from over 90 countries worldwide. Rigaku is exhibiting its benchtop lines of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Raman instrumentation at Booth # 2000-2002.

Rigaku is showing the Rigaku Supermini200 benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new sixth generation Rigaku MiniFlex benchtop X-ray diffractometer, and the Rigaku Micro-Z ULS wavelength dispersive X-ray fluorescence sulfur (S) analyzer at booth # 2000.

The Rigaku Supermini200 analyzer is the world's only high-power (200 W) benchtop sequential wavelength dispersive X-ray fluorescence spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material. It uniquely delivers low cost-of-ownership with high resolution and lower limits of detection (LLD).

Ideally suited for today's fast-paced XRD analyses, the sixth generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high-speed detector coupled with a powerful 600 W X-ray source. The MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. Designed for measurement of ultra-low level sulfur in diesel, gasoline and other fuels, the Rigaku Micro-Z ULS wavelength dispersive X-ray fluorescence (WDXRF) instrument is a benchtop spectrometer with fixed optics optimized for sulfur analysis. It features a novel design that measures both the sulfur peak and the back-ground intensity.

Applied Rigaku Technologies (ART) is introducing the new Rigaku NEX LS Scanning Multi-element Process Coatings Analyzer at booth # 2001. Featuring advanced third generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX LS analyzer represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. The measuring head, mounted on a rigid beam is equipped with a linear traversing mechanism ensuring constant head-to-surface distance.

The ART division is also presenting the Rigaku NEX QC series of low-cost benchtop EDXRF spectrometers. The NEX QC and NEX QC+ systems are compact elemental analyzers with intuitive “icon-driven” touch screens interface and built-in printer for easy operation and convenience. The Rigaku NEX QC+ QuantEZ analyzer, engineered for heavy industrial use, runs on Microsoft Windows-based QuantEZ analytical software.

The Rigaku NEX DE series of high-performance, direct excitation energy dispersive XRF (EDXRF) elemental analyzers is also available. The newest addition to the NEX DE series is the Rigaku NEX DE VS direct excitation variable spot X-ray fluorescence elemental analyzer. The NEX DE VS is uniquely suited for small spot analysis. It features a high-resolution camera combined with automated collimators allowing for precise positioning of a sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes.

For on-line elemental analysis, the ART division presents the NEX OL process elemental analyzer. The NEX OL enables real-time process elemental analysis for liquid stream applications. It is also designed to service web and coil applications, with the ability to analyze multi-element composition and/or coating thickness.

Handheld and portable spectrometers from Rigaku Analytical Devices are displayed at booth #2002. RAD is featuring their latest Raman and laser induced breakdown (LIBS) analyzers, including the Rigaku Progeny ResQ 1064nm handheld Raman analyzer and the new Rigaku KT-100S handheld LIBS spectrometer.

Links

Tags

Fluorescence SpectroscopyFluorometers and spectrofluorometers (also called fluorescence spectrometers) are used to measure the intensity and wavelength of fluorescent light emitted from a sample after excitation by illumination. Spectrofluorometers utilize monochromators to select the desired wavelengths, whereas filter fluorometers employ a set of filters. Spectrofluorometers for measuring steady-state fluorescence and lifetime fluorescence (or time-resolved fluorescence) are available, as well as fluorescence microscopes and microplate readers. Find the best fluorescence spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.PittconPittcon is one of the largest conferences and exhibitions dedicated to laboratory science. It brings together professionals and innovators in analytical chemistry, physics, and biology, offering a platform to explore the latest scientific tools and technologies. From cutting-edge laboratory instruments to emerging research trends, Pittcon is a must-attend event for professionals in research and development. X-Ray FluorescenceX-ray fluorescence (XRF) is an analytical technique used to determine the elemental composition of materials. It is widely used in geology, materials science, and environmental testing for detecting heavy metals and other elements. Browse our peer-reviewed product directory to find the best XRF systems, compare products, check reviews, and get pricing directly from manufacturers.