Powder X-ray Diffractometers Used to Measure Bulk Samples in Proper Conditions

5 Jun 2017
Emily Adam
Publishing / Media

Industry news

Rigaku Corporation has published an application report on its global website demonstrating the utility of X-ray diffraction (XRD) in the analysis of bulk samples with curved surfaces. The analysis described highlights the capabilities of the Rigaku MiniFlex general purpose X-ray diffractometer.

Powder X-ray diffractometers can readily measure bulk samples, given appropriate sample preparation techniques and measurement conditions. When measuring samples such as pharmaceutical tablets, which have curved surfaces, various effects are seen due to the curvature. These can include shifting of the diffraction angle and widening of the full width at half maximum. As demonstrated in the report, in cases of samples with these kinds of surfaces, adjustments can be made so that the sample surface is at the same height as the reference surface of the sample plate, reducing the effects of curvature. The effects can be further reduced by performing the measurement while narrowing the divergence slit and the incident height-limiting slit.

The example presented in the report shows that it is possible to identify the active ingredients in tablets such as ibuprofen and ethenzamide.

The bulk sample article, along with other pharmaceutical-related XRD analyses, can be seen at: https://www.rigaku.com/en/products/xrd/miniflex/apps/11

The newly introduced sixth generation MiniFlex X-ray diffractometer is a multipurpose analytical instrument that can determine phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure.

MiniFlex Benchtop XRD

Rigaku Corporation

New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.   Overview: New 6th generation design Compact, fail-safe radiation enclosure Incident beam variable slit Simple installation and user training Factory aligned goniometer system Laptop computer operation Measurements: Phase identification Phase quantification Percent (%) crystallinity Crystallite size and strain Lattice parameter refinement Rietveld refinement Molecular structure Options: 8-position autosampler Graphite monochromator D/teX Ultra: silicon strip detector HyPix-400 MF: 2D HPAD detector Air sensitive sample holder Travel case

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X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.CrystallizationSample ProcessingSample processing is required to prepare samples prior to analysis. Technologies used for sample processing include homogenizers, grinders, mills and mixers.Sample PreparationProtein BiologyThe analysis of protein expression, identity and function is vital for many areas of life science research and drug discovery. Some of the most commonly used techniques in protein analysis include Western blotting, electrophoresis and mass spectrometry.