ResourceSpectroscopy
XPS Analysis of Chemical Bonding States in an Ionic Liquid
6 Mar 2013In this application note the Thermo Scientific K-Alpha XPS was used to analyze the elemental and chemical composition of a worn steel surface, coated with an ionic liquid. Different points on the worn surface were found to have different carbon chemistry, and the thickness of the ionic liquid layer was determined to be at least 10 nm.
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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MetalsMetal analysis is critical in various industries, including environmental monitoring, food safety, and pharmaceuticals. Techniques such as ICP-MS and atomic absorption spectrometry are commonly used to detect trace metals. Explore metal analysis tools in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.Metallurgy