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Using DualBeam to Prepare the Highest Quality Samples for Atomic Scale HR-S/TEM
4 Feb 2015LaB6 emitters are widely used in electron microscopy as high brightness electron sources, owing to their favorable properties for thermionic emission: low work function and high melting point. The emitter consists of a LaB6 single crystal with a carefully shaped tip. This case study offers an unprecedented characterization of a worn-out LaB6 emitter down to the atomic level.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Emitters