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Time-dependent plasticity in high-temperature pillar compression

24 Jul 2023

Structural materials in demanding applications can be subject both to high stresses and high temperatures simultaneously. The combination of stress and temperature in metals often leads to time-dependent plastic responses, or creep, which can easily lead to premature failure. Creep at temperature is commonly studied with bulk-scale specimens, but can also be done at the microscale. In-situ SEM micro-pillar compression allows specific regions of the microstructure, such as individual grains, to be targeted and allows for high-resolution characterization of the deformation mechanisms.

In this application note, Bruker Nano discusses in-situ SEM micro-pillar compression tests of a Ni-based superalloy, IN718, at 650°C tested with three types of load functions designed to probe the time-dependent response. These include a linear quasistatic loading, a stress relaxation test, and a strain rate jump test. The use of in-situ SEM has additional synergy with high-temperature testing, as the high vacuum of the SEM helps protect the material from oxidation during testing.

Hysitron PI 89

Bruker Nano Surfaces and Metrology

The Hysitron PI 89 SEM PicoIndenter leverages the advanced imaging capabilities of scanning electron microscopes (SEM, FIBSEM, PFIB), making it possible to perform quantitative nanomechanical testing while simultaneously imaging. Enabled testing techniques include nanoindentation, tensile testing, pillar compression, particle compression, cantilever bending, fracture, fatigue, dynamic testing, and mechanical properties mapping.

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Non-Destructive TechniquesNon-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.
Time-dependent plasticity in high-temperature pillar compression