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Thickness Analysis of a Natural Oxide Film on a Microscopic Si Pattern

JASCO (USA)

Thickness Analysis of a Natural Oxide Film on a Microscopic Si Pattern

8 Jul 2015

In this application note, the thickness of the SiO2 layer on a sample was analyzed from an obtained reference spectra using the MSV-5000 from JASCO. The MSV-5000 series micro-spectrophotometer is ideal for transmission and reflection measurements of samples as small as 10 μm diameter over a wide wavelength range from the ultraviolet to the near-infrared wavelengths.

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V-780 UV-Visible/NIR Spectrophotometer

JASCO (USA)

The V-780 UV-Visible-Near Infrared (UV-Vis/NIR) spectrophotometer features a monochromator with automatically exchanged dual gratings: 1200 lines/mm for the UV/VIS region; 600 lines/mm for the NIR region. A PMT detector is provided for the UV-visible region and a high sensitivity InGaAs photodiode detector is employed for the NIR region. Both gratings and detectors are automatically exchanged within the user selectable 800 to 900 nm range.

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Infrared / IR SpectroscopyInfrared (IR) spectroscopy measures the interaction of infrared light with a sample, including transmission, reflectance & absorbance, facilitating the identification of analytes. Equipment used for quantitative analysis includes Fourier-transform infrared (FTIR) spectrometers, infrared cameras, FTIR gas analyzers, as well as attenuated total reflectance (ATR) accessories and pellet or film presses. Find the best IR spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.UV-Visible SpectroscopyUltraviolet-visible (UV-Vis) spectrophotometers are used to measure the interaction of UV and visible light with a sample, including transmission, reflectance & absorbance. The two major instrument classes are single-beam or double-beam spectrophotometers. More specialized equipment includes colorimeters, spectroradiometers and refractometers. Portable and microvolume spectrophotometers are also available. For the modular spectroscopy lab, explore a range of light sources for combination with a spectrograph/spectrometer and optics. Find the best UV-Vis spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Non-Destructive TechniquesNon-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.Surface Area TestingPhysisorption studies fundamental parameters essential for the characterization of materials such as the specific surface area and pore size distribution. Properties such as porosity, strength, hardness, permeability, separation selectivity, corrosion, and thermal stress resistance can all be directly correlated to the porous structure of a material.UV-Visible-NIRUV-Visible-NIR spectroscopy is used to analyze a wide range of samples based on their absorption of ultraviolet, visible, and near-infrared light. It is commonly applied in chemical analysis, material science, and quality control. Browse our peer-reviewed product directory to find the best UV-Visible-NIR spectroscopy systems, compare products, check reviews, and get pricing directly from manufacturers.SpectrometrySpectrometry is a technique used to measure the mass-to-charge ratio of ions. It provides valuable information about the composition, structure, and molecular weight of compounds. Used across a variety of fields, including chemistry, biology, and environmental science, spectrometry is essential for identifying substances, analyzing mixtures, and developing new products. Explore the best spectrometry tools in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.PhotometryThin Films

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Thickness Analysis of a Natural Oxide Film on a Microscopic Si Pattern