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Surface cleanliness detection of silicon substrates by the BeVision M1 static image analyzer
19 May 2025In this application note, Bettersize Instruments demonstrates how the BeVision M1 static image analyser can automatically scan the substrate surface and particle classification based on size and shape.
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Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SiliconParticle Analysis