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Study of Helium Ion Beam Exposed Nanostructures by <i>In Situ</i> AFM with ZEISS MERLIN
20 Jan 2015The AFM Option for the ZEISS MERLIN series combines an innovative high end atomic force microscope (AFM) with a scanning electron microscope (SEM). In situ high-resolution AFM measurements in the SEM become possible, opening up new possibilities for the characterization of nanostructures including information about mechanical, electrical, and magnetic properties as well as chemical surface potential. In this white paper an experiment is described, which demonstrates the power of the AFM/SEM combination for the analysis of helium ion beam exposed nanostructures.
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Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.NanomaterialsNanomaterials such as carbon nanotubes, fullerenes and nanoparticles are a group of materials that measure between 1-1000nm for a single unit. Analysis techniques include AFM, electron microscopy and super resolution microscopy.