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Stabilizing the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization via dual-frequency resonance tracking
30 Jul 2020In this application note, Park Systems images ferroelectric domains of a bismuth ferrite (BFO) film with resonance-enhanced piezoelectric force microscopy (PFM) on a Park Systems NX10 Atomic Force Microscope (AFM) with a Zurich Instruments HF2 lock-in amplifier (LIA).
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.AFM