Quantitative mechanical property mapping at the nanoscale with PeakForce QNM

21 Jun 2023

The scanning probe microscope (SPM) has long been recognized as a useful tool for measuring the mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with Bruker’s PeakForce QNM^®, it is possible to identify material variations unambiguously and at high resolution across a topographic image. In this application note, explore the principles and benefits of the PeakForce QNM imaging mode.

Related products

Request Quote for All Products

PeakForce QNM
Bruker Nano Surfaces and Metrology
Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which records very fast force response curves at every pixel in the image. The force control made possible by this technique leads to longer probe lifetimes and improved sample integrity, as well as correlated, high-resolution nanomechanical and topographic data. These capabilities dramatically exceed those of any other technique for nanoscale materials characterization, changing the perception and use of AFM.
(0)
Dimension Icon
Bruker Nano Surfaces and Metrology
Bruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility.
(0)
MultiMode 8-HR
Bruker Nano Surfaces and Metrology
The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.
(0)
PeakForce QNM
Bruker Nano Surfaces and Metrology
Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which records very fast force response curves at every pixel in the image. The force control made possible by this technique leads to longer probe lifetimes and improved sample integrity, as well as correlated, high-resolution nanomechanical and topographic data. These capabilities dramatically exceed those of any other technique for nanoscale materials characterization, changing the perception and use of AFM.
(0)
Dimension FastScan™
Bruker Nano Surfaces and Metrology
World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.Dimension FastScan™ Features: Work hundreds of times faster with fast scanning rates up to frames per second, automated laser and detector alignment, comprehensive work flow and smart engaging Built-in measurement automation software in conjunction with higher speed ScanAsyst® provide exceptional measurement confidence and repeatability Precise force control at the tip renders high resolution and long tip-life Low-noise, temperature-compensated sensors in the scanners maintain sub-nanometer noise levels Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift Sample from subnanometer to hundreds of nanometers in height without loss of resolution
(0)