ResourceSpectroscopy
Probing Organic Self-Assembled Monolayers (SAMs) on Silicon by FTIR with Single Reflectance ATR
17 Aug 2014This application note shows that FTIR-ATR is a convenient and reliable analytical technique to monitor the formation and modification of SAMs on silicon substrates. Compared to conventional surface analytical tools, presented single reflectance FTIR-ATR using a Ge crystal provides a feasible and convenient way to obtain finger prints of SAMs on silicon substrates.
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Infrared / IR SpectroscopyInfrared (IR) spectroscopy measures the interaction of infrared light with a sample, including transmission, reflectance & absorbance, facilitating the identification of analytes. Equipment used for quantitative analysis includes Fourier-transform infrared (FTIR) spectrometers, infrared cameras, FTIR gas analyzers, as well as attenuated total reflectance (ATR) accessories and pellet or film presses. Find the best IR spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Attenuated Total ReflectanceSilicon