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Prisma E SEM product brochure
Flexible and easy to use SEM for the widest range of samples, ideal for multi-user laboratories
23 Jan 2020In this product brochure, Thermo Fisher Scientific outline how the Thermo Scientific™ Prisma™ E SEM is designed to be a highly flexible scanning electron microscope (SEM) capable of all-around performance under a variety of conditions. With its low vacuum and environmental SEM (ESEM) modes, it is fully equipped to analyze charging, outgassing or otherwise difficult samples.
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Prisma™ E SEM for Materials Science
Thermo Fisher ScientificA complete SEM for multi-user laboratories requiring all-around performance and ease-of-use.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.