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Photoluminescence Characterization of GaN Alloys and Other Semiconductor Microstructures

24 Dec 2017

GaN and related alloys are important materials used to build short-wavelength light sources (lasers and LEDs). Room- and low-temperature photoluminescence (PL) are used to characterize these materials as well as device performance. Parameters such as IQE of quantum wells (QW) can be measured for patterned structures using selective optical excitation of microstructures made from these materials. Selective excitation means fine control of laser-excitation beam size and positioning, and visualization of the sample under measurement.

MicOS Microscope Optical Spectrometer

HORIBA Scientific

MicOS is a fully integrated and flexible microscope spectrometer that combines a microscope head with a high-performance, triple grating, imaging spectrometer that can accommodate up to 3 different detectors. MicOS  is the ideal system for semiconductor microstructure characterization, micro LEDs, micro and macro photoluminescence, photoluminescence mapping of semiconductor wafers.

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Photoluminescence Characterization of GaN Alloys and Other Semiconductor Microstructures