ResourceLife Sciences
Optics and Nanomaterials; Using the Evolve 512 Delta EMCCD Camera in Ellipsometry.
28 Jul 2015In the optics and nanomaterials lab, ellipsometry is the technique that is used which involves probing materials with light that is sent to the sample, changing its polarization state. This causes the signal to bounce, which is then detected by a simple detector. This case study focuses on the use of the Evolve 512 Delta EMCCD Camera as the detection device, optimizing the detection of the sample’s attachment.
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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.EMCCDCCD cameraImagingImaging techniques are essential for obtaining visual representations of samples to understand structures, processes, and function in biological, chemical, and physical research. These tools range from traditional light microscopy to advanced imaging modalities like MRI and electron microscopy, providing researchers with valuable data for diagnostics, drug discovery, and material analysis. Explore imaging solutions in our peer-reviewed product directory to compare products, check reviews, and get pricing directly from manufacturers.BioimagingNanomaterialsNanomaterials such as carbon nanotubes, fullerenes and nanoparticles are a group of materials that measure between 1-1000nm for a single unit. Analysis techniques include AFM, electron microscopy and super resolution microscopy.Single Molecule DetectionSample TrackingEllipsometry